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1

Transient detection in COTS processors using software approach

Amir Rajabzadeh, Seyed Ghassem Miremadi

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 168 KB

english, 2006

2

CFCET: A hardware-based control flow checking technique in COTS processors using execution tracing

Amir Rajabzadeh, Seyed Ghassem Miremadi

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 183 KB

english, 2006

3

[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Investigating the effects of process variations and system workloads on endurance of non-volatile caches

Monazzah, Amir Mahdi Hosseini, Farbeh, Hamed, Miremadi, Seyed Ghassem

Year:

2017

Language:

english

File:

PDF, 311 KB

english, 2017

4

Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring Features

Amir Rajabzadeh, Seyed Ghassem Miremadi, Mirzad Mohandespour

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 354 KB

english, 2004

5

[IEEE 2009 European Conference on Circuit Theory and Design (ECCTD 2009) - Antalya, Turkey (2009.08.23-2009.08.27)] 2009 European Conference on Circuit Theory and Design - A low voltage CMOS analog multiplier with high linearity

Miremadi, Amir H., Ayatollahi, Ahmad, Abrishamifar, Adib, Siadatan, Alireza

Year:

2009

Language:

english

File:

PDF, 532 KB

english, 2009

6

[IEEE 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Budapest, Hungary (2013.06.24-2013.06.27)] 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - FTSPM: A Fault-Tolerant ScratchPad Memory

Monazzah, Amir Mahdi Hosseini, Farbeh, Hamed, Miremadi, Seyed Ghassem, Fazeli, Mahdi, Asadi, Hossein

Year:

2013

Language:

english

File:

PDF, 739 KB

english, 2013

7

[IEEE 2012 15th Euromicro Conference on Digital System Design (DSD) - Cesme, Izmir, Turkey (2012.09.5-2012.09.8)] 2012 15th Euromicro Conference on Digital System Design - Using Genetic Algorithm to Identify Soft-Error Derating Blocks of an Application Program

Arasteh, Bahman, Rahmani, Amir Masoud, Mansoor, Ali, Miremadi, Seyed Ghassem

Year:

2012

Language:

english

File:

PDF, 348 KB

english, 2012

8

Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent Features

Arasteh, Bahman, Miremadi, Seyed Ghassem, Rahmani, Amir Masoud

Journal:

Journal of Electronic Testing

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

9

[IEEE 2011 NORCHIP - Lund, Sweden (2011.11.14-2011.11.15)] 2011 NORCHIP - A low voltage low power CMOS analog multiplier

Miremadi, Amir H., Ayatollahi, Ahmad, Abrishamifar, Adib

Year:

2011

Language:

english

File:

PDF, 1.36 MB

english, 2011

10

[IEEE 2010 Third International Conference on Dependability (DEPEND) - Venice, Italy (2010.07.18-2010.07.25)] 2010 Third International Conference on Dependability - Feature Specific Control Flow Checking in COTS-Based Embedded Systems

Rajabzadeh, Amir, Miremadi, Seyed Ghassem

Year:

2010

Language:

english

File:

PDF, 348 KB

english, 2010

11

[IEEE 2010 NORCHIP - Tampere, Finland (2010.11.15-2010.11.16)] NORCHIP 2010 - A novel simple and high performance structure for improving CMRR: Application to current buffers and folded cascode ampilifier

Amir Hossein Miremadi,, Faraji Baghtash, Hassan

Year:

2010

Language:

english

File:

PDF, 215 KB

english, 2010

12

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A data recomputation approach for reliability improvement of scratchpad memory in embedded systems

Sayadi, Hossein, Farbeh, Hamed, Monazzah, Amir Mahdi Hosseini, Miremadi, Seyed Ghassem

Year:

2014

Language:

english

File:

PDF, 181 KB

english, 2014

13

LER: Least Error Rate Replacement Algorithm for Emerging STT-RAM Caches

Monazzah, Amir, Farbeh, Hamed, Miremadi, Seyed

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 1.13 MB

english, 2016

14

An Efficient Protection Technique for Last Level STT-RAM Caches in Multi-Core Processors

Azad, Zahra, Farbeh, Hamed, Monazzah, Amir Mahdi Hosseini, Miremadi, Seyed Ghassem

Journal:

IEEE Transactions on Parallel and Distributed Systems

Year:

2016

Language:

english

File:

PDF, 2.50 MB

english, 2016

15

[IEEE 2016 12th European Dependable Computing Conference (EDCC) - Gothenburg, Sweden (2016.9.5-2016.9.9)] 2016 12th European Dependable Computing Conference (EDCC) - Investigating the Effects of Process Variations and System Workloads on Reliability of STT-RAM Caches

Cheshmikhani, Elham, Monazzah, Amir Mahdi Hosseini, Farbeh, Hamed, Miremadi, Seyed Ghassem

Year:

2016

Language:

english

File:

PDF, 577 KB

english, 2016

16

[IEEE 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC) - Chiba, Japan (2017.1.16-2017.1.19)] 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC) - WIPE: Wearout Informed Pattern Elimination to Improve the Endurance of NVM-based Caches

Asadi, Sina, Monazzah, Amir Mahdi Hosseini, Farbeh, Hamed, Miremadi, Seyed Ghassem

Year:

2017

Language:

english

File:

PDF, 214 KB

english, 2017

17

[IEEE 2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) - Taipei, Taiwan (2017.7.24-2017.7.26)] 2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) - QuARK: Quality-configurable approximate STT-MRAM cache by fine-grained tuning of reliability-energy knobs

Monazzah, Amir Mahdi Hosseini, Shoushtari, Majid, Miremadi, Seyed Ghassem, Rahmani, Amir M., Dutt, Nikil

Year:

2017

Language:

english

File:

PDF, 866 KB

english, 2017

18

A scalable high-linearity two-step DTC-assisted voltageâto-time converter with rail-to-rail input-range for time-based circuits

Miremadi, Amir Hossein, Hashemipour, Omid

Journal:

AEU - International Journal of Electronics and Communications

Year:

2021

File:

PDF, 1.10 MB

2021